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Efficient Data Representations for Eddy Current and Ultrasonic Applications
Fredrik Lingvall
Licentiate Thesis, Signals and Systems, Uppsala University, March 2000.
Paper copies of the thesis can be obtained from Ylva Johansson, Signals and Systems
Group, Uppsala University, Box 534, SE-75121 Uppsala, Sweden.
- Abstract:
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Efficient data representation and choice of suitable basis (representation) are the
main issues addressed in the thesis. Three separate applications are presented:
two are in the field of non-destructive testing, while in the third methods for
reconstructing room temperature distributions based on ultrasonic measurements
are considered.
The need for compact representation arises from the limited
amount of data available for the classification of material defects and for
temperature estimation, respectively. The main goal that was common for the
first two projects was developing software tools of self-learning type, suitable for
automatic classification of defects in multi-layer aluminum aircraft structures
and welds in steel material, respectively. Different NDT methods were used in
both cases, eddy current for the aircraft structures and ultrasonics for welds.
A compact data representation was necessary in both cases, due to the low number
of examples available for training the classifiers. This was accomplished by
compressing the high dimensional data vector, obtained from the measurements,
using various truncated bases, such as: wavelets, Fourier, and principal
component bases.
Efficient data representation was also a crucial part of the
third project. The aim was to reconstruct a 2D-temperature distribution in many
points of a room, based on a limited number of measurements (time of flight of
an ultrasonic wave). To achieve a satisfactory performance strong prior
knowledge regarding the reconstructed surface was necessary. The prior
knowledge was incorporated by expressing the temperature distribution using
suitable base functions. Computer simulations revealed that the principal
component basis (specific for the measured data) clearly outperformed other
more general base function sets (for instance, wavelets), which confirmed the
importance of a suitable data representation.
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